Sunday, October 3, 2010
EuMW Exhibition 2010: from A to Z
B is for broadband time delays product line from Hittite, a DC to 24 GHz analog time delay that supports data transmission to 32 Gbps or clock signal delay up to 24 GHz.
C is for cross correlation Phase Noise analyzers from Holzworth for either fixed or tunable DUT test frequencies.
D is for distortion, an increasing concern highlighted by the importance of IM levels and a driving factor behind Creowave’s announcement that they have developed low PIM filtering solutions to measure the performance of base stations.
E is for EADS Defence & Security making the name change to Cassidian, just in time for their presentation at the Defence/Security Executive Forum
F is for FE-BI (finite element boundary integral) hybrid solver from Ansoft, details to follow in the months to come.
G is for GaN which made an appearance with numerous vendors from RFHIC (1 KW PA) to ACCEL-RF (GaN life test systems)
H is for High purity alumina ceramics with excellent electrical insulation, chemical resistance and low dielectric constant introduced by Brush Ceramic Products, Inc.
I is for ICEbreaker, the newest nonlinear device modeling software tool, free from NMDG
J is for jitter analysis, made easier by the new “C” series of Tektronix AWG instruments which reduce waveform creation times by 45 percent compared to prior AWG instruments, targeting high-speed serial and wideband RF/microwave designs.
K is for K-band MMIC design, getting a boost with the new optical .15 um PHEMT process from TriQuint’s foundry.
L is for Liquid Crystal Polymer (LCP) QFN, air cavity packages that support finer lead pitches, thinner lead frames and shorter wire bond lengths in a near hermetic, ROHS-compliant solution from RJR Polymers
M is for mixed-signal active load-pull from Anteverta, featured in our September issue and on display at their stand within the Agilent partners’ pavilion
N is for NEL Frequency Controls Inc.’s latest ultra low phase noise OCXO at 100 MHz with close-in phase noise of -105 dBc/Hz at 10 Hz and -178 dBc/Hz phase noise on the floor.
O is for output powers of 600 W UHF RF power from NXP’s BLF888A LDMOS device targeting broadcast transmitters and industrial applications, reported to be the most powerful LDMOS broadcast transistor in the market to date.
P is for Precision Devices which announced an ultra low noise and ultra stable crystal oscillator with a phase noise floor of -168 dBc at 10 kHz and excellent stability at a precision of only 0.0002 ppm (or 0.2 ppb – parts per billion) over a temperature range of 0 to +70°C or 0.0005 ppm at -20° to +70°C.
Q is for quality factor, a critical measure of passive device electrical performance and a differentiator for Dielectric Labs’ High-Q capacitor series.
R is for the Russian microwave market, represented by Pluton, manufacturers of frequency-agile magnetrons.
S is for small, as in the industry’s first PXI VNA from National Instruments
T is for the TWT based on a mini-helix technology being launched by e2v
U is for universal oscilloscopes from Rohde & Schwarz with 500 MHz bandwidth, 5 Gsample per second and a memory depth of up to 8 Msample make them ideal for testing and debugging analog and digital circuits with low clock rates.
V is for Vector signal analysis software from Agilent to assist R&D engineers performing signal and modulation analysis
W is for Wall, as in A.T. Wall, manufacturer of seamless tubing and high-speed stamping and proud sponsor of the Defense/Security Executive Forum at EuMW
X is for X-band core chips from M/A-Com Tech Asia, highly-integrated core chips that provide high-levels of functionality to greatly simplify the design of T/R modules.
Y is for yield analysis in Microwave Studio from CST is based on evaluating the s-parameter dependencies on various model parameters on the basis of one simulation without restarting the full-wave simulation, thus offering users a considerable speed-up.
Z is for Z-Communications, manufacturers of VCOs and PLLs announced a new line of waveguide solutions including full-band waveguide-to-coax-adapters along with precision, low powered waveguide terminations covering 5 GHz to 40 GHz.
Saturday, October 2, 2010
EuMW 2010 Exhibition Report: The lay of the land
CNIT Paris is the biggest conference and exhibition center in Europe, containing more than 3 Amphitheatres, 21 adaptable rooms, and has over 17,000 square meters of exhibition area. The exhibition, which opened Tuesday, was in the lower regions of the convention center and the relatively low ceiling either gave the show an intimate or claustrophobic feel, depending on one’s perspective.
Without the usual signs draped from the ceiling above the larger exhibition booths, attendees were forced to navigate the space at the floor level, changing the scale of the entire show - for better or worse. Finding certain exhibitors may have been harder in some cases, but the layout may also have helped force attendees to be more aware of their surroundings and discover vendors they might otherwise have breezed by.
The entrance to the exhibition space was dominated by test and measurement equipment vendors – Agilent, Rohde & Schwarz and Anritsu. Agilent commanded the front of the exhibition hall with an impressive stand filled with no less than eight demo stations, meeting room and a half dozen additional demo stations for partnering companies including Maury Microwave, AMCAD, Anteverta Microwave and SATIMO.
Adjacent to Agilent was the European T&M home team of Rohde & Schwarz, also displaying the latest in their test solutions. Stage left of R&S was Anritsu, a manufacturer which has had a flurry of new product releases over the past several months, much of which was on display for the first time at EumW. Anyone shopping for test equipment could easily spend their time in this one area of the trade show.
While the floor traffic was not exceptionally crowded, it was respectable and constant. In conversations with exhibitors, most were happy with the quality of people they met at the show and many of them were either closing deals or making worthy new contacts. While many exhibitors were not introducing new products explicitly for this event, many had new products that had never been seen by this show’s attendees. Combined with a “better than last year” economic outlook, most exhibitors were poised for growth… and even vocal about it. That is certainly a 180 degree turn around from 2008, when the crisis had just hit and no one knew what the future had in store.
With the conferences on a separate floor, it was not immediately apparent how many delegates managed to get over to the exhibition. The conference organizers did promote the exhibition to delegates during the plenary session and with few complaints from exhibitors, I am assuming most ventured into the exhibition at some point during the week. To summarize, the general feel of the show, it was upbeat if not giddy and the majority of vendors will likely go to next years' show in Manchester UK. All in all, I would say this year's event "got the intended job done".
Tuesday, September 28, 2010
TriQuint's New 0.15um PHEMT Unveiled at EumW
TQP15 is based on TriQuint’s well-established Pseudomorphic High Electron Mobility Transistor (pHEMT) process portfolio and represents both and evolutionary step in their technical development as well as stable technology built on well-established process techniques. This is the best of both worlds – new capabilities based on trusted and proven tools. At the heart of the processing breakthrough that supports the 0.15um gates is the TQP15 utilization of optical lithography (based on their i-line stepper) to reduce cost when compared to traditional E-beam based solutions. The process also incorporates refractory gate metal architecture which does not exhibit the standard metal gate sinking failure mechanism of non-refractory gate pHEMT processes. The TQP15 is targeting at the Ka-band segment and is designed for cost-effectively building millimeter wave (mmWave) MMICs for applications such as VSAT, satellite communications and point to point radios.
TQP15 offers an economical high-frequency pHEMT process designed for high volume runs. The company claims to have already produced thousands of wafers. The company has successfully used TQP15 for high efficiency amplifiers and control functions up to K-band frequencies, and look forward to using this process to grow our product portfolio through Ka band. Performance highlights include a power density of 740 mw/mm at 24 GHz with over 50% PAE, which hit a maximum at P1db rather than the typical 3 db into compression. This means optimum PAE can be achieved at lower drive levels than most common PHEMT devices. They demonstrated 10 db MSG as well as usable gain up to 50 db.
The transistors have a 14 v breakdown, Idss of 380 mw/mm, noise figure of 0.6 db at 15 GHZ (and low sensitivity between source matching impedance and optimum noise figure), Of note for reference designs was a 40 GHz 3 stage power amplifier developed as a demonstration of capabilities. Adding TQP15 solidifies Triquint position as a technology leader of HBT, E-beam and optical pHEMT technologies. Together with their other fully released optical pHEMT technologies, TQPED and TQP13-N, and the soon to be released TQP25 process, TriQuint is focused on enabling the commercialization of mmWave markets, said Mike Peters, Director of Marketing for Commercial Foundry at TriQuint. This was certainly believable from the information presented and positive audience reaction.
Monday, September 27, 2010
EumW Conference Starts, Exhibition Set-up for Tuesday Opening
Since there are an impressive number of European Microwave companies engaged in nonlinear device characterization and the development of related test systems, it is appropriate that the European Microwave Week exhibition will feature a sizable representation of companies offering load-pull and related test solutions. Several of these companies were mentioned in last March’s cover story on non-linear Characterization and device modeling including Mesuro, NMDG, AMCAD and Verspecht-Teyssier-DeGroote. Each of these companies has developed the test systems and software for measuring transistor behavior under large signal conditions and generating compact or behavioral models, such as the Cardiff or poly-harmonic distortion (PHD) models. North American companies such as Maury Microwave of California and Focus Microwave of Canada will also be at the show along with the major test equipment vendors that these specialized partner with (i.e. Agilent, Rohde & Schwarz and Anritsu).
And so, just in time for the exhibition, NMDG has just announced the release of their new ICEBreaker application, which provides comprehensive visualization of measurement data sets. This application, which is free, can be upgraded to perform generic sweep plans such as DC, power and/or loadpull sweeps, and to collect measurement data in an accurate way. In addition, the company announced that nonlinear characterization under pulsed DC and pulsed RF conditions is now available in the NMDG ICE software platform, implemented to work with different types of receivers and pulsers.NMDG will be presenting live demos of the NM600 Fast Source and Load Pull under pulsed conditions and of the S-functions model extraction under mismatched conditions using the NM300 ZVxPlus solution this week at Rohde & Schwarz Booth #70 during the conference.
Suede was a bad idea
It is hard to complain about location when the European Microwave Week makes its way to Paris once every half dozen years or so. It is a beautiful city. To quote an e-mail received from a M/A-Com attendee – “ PS - I love Paris!!!!”. I might take fault with weather.com, which predicted sunny days in the mid-sixties. Instead, the air is about 10 degrees cooler and the skies look threatening. Bringing my suede jacket was probably a mistake. Regardless, fall is a great time to be in the land of Coulomb and Ampére.
I took the Saturday night red eye from Boston along with MWJ publisher, Carl Sheffres (seen here overlooking the city). We spotted at least one microwave luminary, Rich Jerome on the plane with us. Several others were already standing around the hotel lobby as we checked in near the convention center. Microwave Journal’s parent company, Horizon House had already sent most of its exhibition support team half a week in advance, to begin preparations for the show taking place at the CNIT La Defense convention center. For us non-smokers, check-in would have to wait and so it was a quick fueling up of double espressos in the lobby and off to the train in order to catch some Sunday sightseeing, my only free day this week.
My schedule looks pretty full with meetings throughout the week, specifically with the test & measurement manufacturers – Rohde & Schwarz, Anritsu, Tektronix and Agilent (whom I already had a pre-show press briefing); a number of smaller nonlinear characterization companies, i.e. load pull including Maury Microwave, Focus, AMCAD, VTD, NMDG; integrated device manufacturers such as TriQuint, M/A-Com, and Analog Devices and software suppliers – AWR, Ansoft, CST and Sonnet. During its first ten years, SATIMO performed research and prototyping of antennas, antenna measurement systems, non-destructive testing equipment, and tomographic imaging systems. SATIMO was entirely focused on the French Market and relied only on few customers. The founder, Prof. Jean-Charles Bolomey, decided to drastically change this situation by naming Philippe Garreau as the C.E.O. of SATIMO.
Au revoir for now. If you’re heading to the show, dress warm and pack an umbrella, just in case. And don’t forgot to sign up for the MWJ/Euma European Defence Executive Forum for Wednesday early evening. This should be an informative set of presentations and worthwhile networking opportunity.
Wednesday, September 15, 2010
EuMW 2010 Show Coverage
In addition, the Sept issue dedicated to EuMW 2010 is also online now including conference articles, messages from the chairs, exhibitor list, new products and our cover feature about the Handset RF front-end market.
Let us know what you are featuring at the show in the comments below. Hope to see you in Paris!




